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IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

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IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
雜志名稱:IEEE器件和材料可靠性匯刊
簡稱:IEEE T DEVICE MAT RE
期刊ISSN:1530-4388
大類研究方向:工程技術
影響因子:1.583
數據庫類型:SCIE
是否OA:No
出版地:UNITED STATES
年文章數:98
小類研究方向:工程技術-工程:電子與電氣
審稿速度:較慢,6-12周
平均錄用比例:較易

官方網站:http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7298

投稿網址:http://mc.manuscriptcentral.com/tdmr

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IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

英文簡介

IEEE Transactions on Device and Materials Reliability is published quarterly. It provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the manufacture of these devices; and the interfaces and surfaces of these materials.

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

中文簡介

IEEE設備和材料可靠性事務季刊。它提供對可靠電子設備和材料的創造至關重要的前沿信息,并在電子設備及其制造中使用的材料的可靠性方面成為跨學科交流的重點。它側重于電子、光學、磁器件和微系統的可靠性;用于制造這些裝置的材料和工藝;以及這些材料的界面和表面。

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